Perform a destructive 16-bit wide register IO test.
Each location is tested by sequentially writing a 16-bit wide register, reading the register, and comparing value. This function tests three kinds of register IO functions, normal register IO, little-endian register IO, and big-endian register IO. When testing little/big-endian IO, the function performs the following sequence, Xil_Out16LE/Xil_Out16BE, Xil_In16, Compare In-Out values, Xil_Out16, Xil_In16LE/Xil_In16BE, Compare In-Out values. Whether to swap the read-in value before comparing is controlled by the 5th argument.
Prototype
s32 Xil_TestIO16(u16 *Addr, s32 Length, u16 Value, s32 Kind, s32 Swap);Parameters
The following table lists the Xil_TestIO16 function arguments.
| Name | Description |
|---|---|
| Addr | a pointer to the region of memory to be tested. |
| Length | Length of the block. |
| Value | constant used for writing the memory. |
| Kind | Type of test. Acceptable values are: XIL_TESTIO_DEFAULT, XIL_TESTIO_LE, XIL_TESTIO_BE. |
| Swap | indicates whether to byte swap the read-in value. |
Returns
- -1 is returned for a failure
- 0 is returned for a pass