Reliability Data for Pb-Free Packages

Device Reliability Report (UG116)

Document ID
UG116
Release Date
2024-06-25
Revision
10.18 English

CLG400 and CLG484

Table 1. Test Results for Device Type XC7Z020
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HAST 4 0 175 92,400
HTS 4 0 176 352,000
Temperature cycling –55°C to +125°C 4 0 159 318,000

CPG132

Table 2. Test Results for Device Type XC3S500E
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 2 0 90 135,000
Temperature cycling –55°C to +125°C 2 0 80 120,000
THB 3 0 135 202,500

CSG324

Table 3. Test Results for Device Type XC6SLX45
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HAST 2 0 90 35,640
HTS 2 0 90 135,000
Temperature cycling –55°C to +125°C 2 0 80 160,000

FF1136, FF1148, FF1152, FF1153, FF1154, FF1155, FF1156, FF1157 and FF1158

Table 4. Test Results for Device Type XC6VLX240T
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
THB 1 0 44 66,000

FFG1136, FFG1148, FFG1152, FFG1153, FFG1154, FFG1155, FFG1156, FFG1157 and FFG1158

Table 5. Test Results for Device Type XC6VLX240T and XC5VLX110T
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 4 0 178 267,000
Temperature cycling –55°C to +125°C 4 0 179 268,500
THB 5 0 229 321,000

FFV1136, FFV1148, FFV1152, FFV1153, FFV1154, FFV1155, FFV1156, FFV1157 and FFV1158

Table 6. Test Results for Device Type XCZU15EG, XCKU060, XCKU040, XCZU47DR, XCZU9EG
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 9 0 401 601,500
Temperature cycling –55°C to +125°C 10 0 452 615,500
THB 9 9 394 577,500

FFV1517, FFV1924 and FFV2104

Table 7. Test Results for Device Type XCVU095
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
Temperature cycling –55°C to +125°C 2 0 88 109,500

FGG324 and FGG456

Table 8. Test Results for Device Type XC3S400 and XC3S1000
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 3 0 135 202,500
Temperature cycling –55°C to +125°C 3 0 120 180,000
THB 2 0 90 135,000

FGG484

Table 9. Test Results for Device Type XC7A35T
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HAST 2 0 89 46,992

FGG676

Table 10. Test Results for Device Type XC7A100T
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 2 0 88 132,000
Temperature cycling –55°C to +125°C 2 0 80 120,000

FHG1761 and FHG2104

Table 11. Test Results for Device Type XCVU13P
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 5 0 225 337,500
Temperature cycling –40°C to +125°C 5 0 223 289,500

FLV1517, FLV1924 and FLV2104

Table 12. Test Results for Device Type XCKU115
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
THB 3 0 135 202,500

FSV1156

Table 13. Test Results for Device Type XCZU27DR
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 1 0 76 152,000
Temperature cycling –55°C to +125°C 1 0 44 66,000

FSV2892

Table 14. Test Results for Device Type XCVU47P
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 1 0 44 64,500

FTG256

Table 15. Test Results for Device Type XC3S1200E and XC3S200A
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HAST 1 0 45 23,760
HTS 2 0 89 178,000
Temperature cycling –55°C to +125°C 2 0 76 152,000
THB 2 0 88 176,000

LSV4072

Table 16. Test Results for Device Type XCVP1802
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 4 0 84 84,000
Temperature cycling –40°C to +125°C 4 0 109 109,000
THB 4 0 81 81,000

NBV1024

Table 17. Test Results for Device Type XCVM1402
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
Temperature cycling –55°C to +125°C 6 0 82 82,000

NSV1369

Table 18. Test Results for Device Type XCVM1402
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
Temperature cycling –55°C to +125°C 4 0 58 58,000

SFV625

Table 19. Test Results for Device Type XCZU3EG
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 5 0 225 450,000
Temperature cycling –55°C to +125°C 5 0 225 450,000
THB 3 0 135 270,000

SFV784

Table 20. Test Results for Device Type XCVE2302
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
THB 3 0 81 81,000

Package_VQG_All

Table 21. Test Results for Device Type XC3S250E and XC3S100E
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 2 0 90 135,000
Temperature cycling –55°C to +125°C 2 0 80 120,000
THB 3 0 131 196,500

VSV1596

Table 22. Test Results for Device Type XCVC1702
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
Temperature cycling –55°C to +125°C 6 0 96 96,000

VSV2197

Table 23. Test Results for Device Type XCVC1902
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 4 0 180 270,000
Temperature cycling –55°C to +125°C 4 0 172 245,100
THB 4 0 179 268,500

VSV2785

Table 24. Test Results for Device Type XCVP1202
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
Temperature cycling –55°C to +125°C 6 0 142 142,000

VSV3340

Table 25. Test Results for Device Type XCVP1702 and XCVP1402
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
Temperature cycling –55°C to +125°C 2 0 41 45,100
Temperature cycling –40°C to +125°C 3 0 84 94,800

VSV3697

Table 26. Test Results for Device Type XCVH1542
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 3 0 54 54,000
Temperature cycling –40°C to +125°C 4 0 108 108,000

VSV5601

Table 27. Test Results for Device Type XCVP2802
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 3 0 78 78,000
Temperature cycling –40°C to +125°C 3 0 80 80,000

VSV6865

Table 28. Test Results for Device Type XCVP1902
Reliability Test Lot Quantity Failures Device on Test Total Device Hours/Cycles
HTS 1 0 26 26,000
Temperature cycling –0°C to +125°C 1 0 27 48,600