Failure Rate Summary

Device Reliability Report (UG116)

Table 1. Summary of the Failure Rates
Process Technology	Device Hours at T_J = 125°C	FIT¹
7 nm	1,060,134	11
16 nm	1,152,063	10
20 nm	1,045,925	11
28 nm	1,004,780	12
40 nm	1,057,722	11
45 nm	1,022,514	11
65 nm	1,018,719	12
90 nm	7,592,082	2
130 nm	1,462,363	8
220 nm/180 nm	1,000,645	12
350 nm/250 nm	1,137,973	10
350 nm	1,010,470	12
FIT is calculated based on 0.7 eV (0.58 eV for EPROM), 60% C.L. and T_J of 55°C.