The High-Temperature Storage Life test is conducted under the conditions of
150°C and with the device unbiased.
Summary
Table 1. Summary of High Temperature Storage Life Test Results
| Device |
Lot Quantity |
Fail Quantity |
Device Quantity |
Total Device Hours |
| XC3Sxxx |
3 |
0 |
135 |
202,500 |
| XC3SxxxE |
6 |
0 |
269 |
448,000 |
| XC5VxXxxx |
2 |
0 |
90 |
135,000 |
| XC6Sxxx |
2 |
0 |
90 |
135,000 |
| XC6VxXxxx |
2 |
0 |
88 |
132,000 |
|
7 series FPGAs and Zynq 7000 SoCs
|
6 |
0 |
264 |
484,000 |
| UltraScale devices |
4 |
0 |
179 |
268,500 |
| UltraScale+ devices |
16 |
0 |
748 |
1,272,500 |
| Versal devices |
15 |
0 |
422 |
512,000 |
Data
Table 2. HTS Test Results for XC3Sxxx
| Device |
Lot Quantity |
Fail Quantity |
Device Quantity |
Total Device Hours |
| XC3S1000 |
3 |
0
|
135 |
202,500 |
| XC3Sxxx |
3 |
0
|
135 |
202,500 |
Table 3. HTS Test Results for XC3SxxxE
| Device |
Lot Quantity |
Fail Quantity |
Device Quantity |
Total Device Hours |
| XC3S1200E |
2 |
0
|
89 |
178,000 |
| XC3S250E |
2 |
0
|
90 |
135,000 |
| XC3S500E |
2 |
0
|
90 |
135,000 |
| XC3SxxxE |
6 |
0
|
269 |
448,000 |
Table 4. HTS Test Results for XC5VxXxxx
| Device |
Lot Quantity |
Fail Quantity |
Device Quantity |
Total Device Hours |
| XC5VLX110T |
2 |
0
|
90 |
135,000 |
| XC5VxXxxx |
2 |
0
|
90 |
135,000 |
Table 5. HTS Test Results for XC6Sxxx
| Device |
Lot Quantity |
Fail Quantity |
Device Quantity |
Total Device Hours |
| XC6SLX45 |
2 |
0
|
90 |
135,000 |
| XC6Sxxx |
2 |
0
|
90 |
135,000 |
Table 6. HTS Test Results for XC6VxXxxx
| Device |
Lot Quantity |
Fail Quantity |
Device Quantity |
Total Device Hours |
| XC6VLX240T |
2 |
0
|
88 |
132,000 |
| XC6VxXxxx |
2 |
0
|
88 |
132,000 |
Table 7. HTS Test Results for 7 Series FPGAs and Zynq 7000 SoCs
| Device |
Lot Quantity |
Fail Quantity |
Device Quantity |
Total Device Hours |
| XC7A100T |
2 |
0
|
88 |
132,000 |
| XC7Z020 |
4 |
0
|
176 |
352,000 |
|
7 series FPGAs and Zynq 7000 SoCs
|
6 |
0
|
264 |
484,000 |
Table 8. HTS Test Results for UltraScale devices
| Device |
Lot Quantity |
Fail Quantity |
Device Quantity |
Total Device Hours |
| XCKU040 |
3 |
0
|
134 |
201,000 |
| XCKU060 |
1 |
0
|
45 |
67,500 |
| UltraScale devices |
4 |
0
|
179 |
268,500 |
Table 9. HTS Test Results for UltraScale+ devices
| Device |
Lot Quantity |
Fail Quantity |
Device Quantity |
Total Device Hours |
| XCVU13P |
5 |
0
|
225 |
337,500 |
| XCZU15EG |
1 |
0
|
45 |
67,500 |
| XCZU27DR |
1 |
0
|
76 |
152,000 |
| XCZU3EG |
5 |
0
|
225 |
450,000 |
| XCZU9EG |
4 |
0
|
177 |
265,500 |
| UltraScale+ devices |
16 |
0
|
748 |
1,272,500 |
Table 10. HTS Test Results for Versal devices
| Device |
Lot Quantity |
Fail Quantity |
Device Quantity |
Total Device Hours |
| XCVC1902 |
4 |
0
|
180 |
270,000 |
| XCVH1542 |
3 |
0
|
54 |
54,000 |
| XCVP1802 |
4 |
0
|
84 |
84,000 |
| XCVP1902 |
1 |
0
|
26 |
26,000 |
| XCVP2802 |
3 |
0
|
78 |
78,000 |
| Versal devices |
15 |
0
|
422 |
512,000 |