Optimizing High Fanout Nets - 2021.2 English

Versal ACAP System Integration and Validation Methodology Guide (UG1388)

Document ID
UG1388
Release Date
2021-11-19
Version
2021.2 English

High fanout nets often lead to implementation issues. Because die sizes increase with each device family, fanout problems also increase. It is often difficult to meet timing on nets that have many thousands of endpoints, especially if there is additional logic on the paths, or if they are driven from non-sequential cells, such as LUTs or distributed RAMs.