Revision History

Continuing Experiments of Atmospheric Neutron Effects on Deep Submicron Integrated Circuits (WP286)

Document ID
Release Date
2.1 English

The following table shows the revision history for this document.

Section Revision Summary
4/12/2023 Version 2.1
Experiments Added Leadville, CO to Table 1.
Updated devices in Table 2 and Table 3.
3/22/2016 Version 2.0
General Updated document to reflect additional technology nodes to 16 nm and clarify historical versus ongoing experiments.
10/13/2011 Version 1.1
General Updated document to reflect 40 nm technology node and added Virtex-6 and Spartan-6 FPGA data. Updated Introduction, Table 2, Experiments, Atmospheric Test Results, QCRIT Simulation, Accelerator Test Facilities, Conclusion, Acknowledgments, and References sections.
5/22/2009 Version 1.0.1
General Changed footnote 1 on page 3. Was: FIT/Mb = failures per million hours per Megabit. Is: FIT/Mb = failures per billion hours per Megabit.
3/10/2008 Version 1.0
Initial release. N/A