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Continuing Experiments of Atmospheric Neutron Effects on Deep Submicron Integrated Circuits (WP286)

Document ID
WP286
Release Date
2023-04-12
Revision
2.1 English
  1. Roche, Philippe and Gilles Gasiot. Impacts of Front-End and Middle-End Process Modifications on Terrestrial Soft Error Rate. IEEE Transactions on Device and Materials Reliability, Volume 5, Number 3, September 2005.
  2. Castellani, Karine. 3-D Modeling of Bulk and Multi-gate Transistors and SRAM (summary of research), Laboratoire Matériaux et Microélectronique de Provence (L2MP), UMR/CNRS.
  3. Howe, Christina L., Robert A. Weller, Robert A. Reed, Marcus H. Mendenhall, Ronald D. Schrimpf, Kevin M. Warren, Dennis R. Ball, Lloyd W. Massengill, Kenneth A. LaBel, Jim W. Howard, Jr., and Nadim F. Haddad. Role of Heavy-Ion Nuclear Reactions in Determining On-Orbit Single Event Error Rates. IEEE Transactions on Nuclear Science, Volume 52, Issue 6, December 2005.