Each Rosetta experiment consisted of multiple sets of 100 of the largest available AMD FPGAs using differing technologies, located at different altitudes. All tested components were fabricated by AMD foundry partners, using their planar or FinFET technologies.
The following table lists the locations of the experiments. Table 2 and Table 3 list the device type, technology, and quantity.
Location | Altitude (Feet) | Adjusted Altitude Factor 1 |
---|---|---|
Lead, SD | –5800 2 | 0.00 |
Rustrel, France | –1600 2 | 0.00 |
San Jose, CA | 257 | 0.75 |
Marseilles, France | 359 | 1.08 |
Longmont, CO | 4958 | 4.11 |
Albuquerque, NM | 5145 | 3.34 |
Pic du Bure, France | 8196 | 6.00 |
Pic du Midi, France | 9298 | 8.62 |
Leadville, CO | 10200 | 12.22 |
Echo Lake, CO | 10600 | 13.02 |
Aiguille du Midi, France | 11289 | 12.45 |
White Mountain, CA | 12442 | 19.48 |
Mauna Kea, HI | 13000 | 11.35 |
|
Device Family | Device Number | Technology | Quantity |
---|---|---|---|
Kintex™ 7 FPGAs | XC7K325T | 28 nm | 300 |
Virtex™ 7 FPGAs | XC6VLX240T | 40 nm | 300 |
Spartan™ 6 FPGAs | XC6SLX150 | 45 nm | 200 |
Virtex 4 FPGAs | XC4VLX25 | 90 nm | 400 |
Virtex 4 FPGAs | XC4VLX60 | 90 nm | 300 |
Spartan 3 FPGAs | XC3S1500 | 90 nm | 200 |
Virtex-II FPGAs | XC2V6000 | 150 nm | 300 |
Virtex-II Pro FPGAs | XC2VP50 | 130 nm | 600 |
Device Family | Device Number | Technology | Quantity |
---|---|---|---|
Kintex UltraScale™ FPGAs | XCKU040 | 20 nm | 400 |
Kintex UltraScale+™ FPGAs | XCKU9P | 16 nm | 400 |
Versal™ devices | VC1902 | 7 nm | 300 |
Over the years, the Rosetta program has changed to include prediction of error rates using TCAD modeling, fabrication and beam testing of test devices, beam testing of production devices, and testing using the atmospheric placement of arrays, as well as underground arrays.
In the IC design of the AMD FPGAs, the individual memory cells (implemented as static latches) used for configuration, look-up tables, and block RAM were all simulated for their sensitivity to single event upsets.
To detect alpha contamination in packaging and assembly, the experimental groups were rotated through the three altitudes in addition to using the underground facility. Any evidence of a constant upset rate due to alpha particles would be observed as a non-altitude, non-latitude dependent factor in the resulting upsets, or measured directly underground.