QCRIT Simulation

Continuing Experiments of Atmospheric Neutron Effects on Deep Submicron Integrated Circuits (WP286)

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2.1 English

The AMD IC design group uses models and methods from AMD fabrication partners to estimate the potential sensitivity of the memory cells to upsets. These models and methods have been used in their production of other standard products. Their prediction of QCRIT to atmospheric upsets is used to compare with AMD observations in the Rosetta experiment.

AMD then models candidate layouts because they differ in some cases from the foundry layout. After that, AMD fabricates test devices so that beam testing can be done to confirm predictions prior to making a selection of a candidate cell for use in an AMD product.