Serial Link Signal Integrity Analysis with IBIS-AMI Simulation and On-Chip Eye Scan for Low-Cost, High-Volume FPGA Transceivers (WP428) - This white paper describes how IBIS-AMI simulations and 2D Eye Scan—the industry's first on-chip scope for cost-optimized FPGAs—can help analyze system margin at low bit error rates. - WP428

wp428-7Series-Serial-Link-Signal-Analysis.pdf

Document ID
WP428
Release Date
2017-12-07
Revision
1.0.1 English