Serial Link Signal Integrity Analysis with IBIS-AMI Simulation and On-Chip Eye Scan for Low-Cost, High-Volume FPGA Transceivers (WP428) - This white paper describes how IBIS-AMI simulations and 2D Eye Scan—the industry's first on-chip scope for cost-optimized FPGAs—can help analyze system margin at low bit error rates. - WP428
wp428-7Series-Serial-Link-Signal-Analysis.pdf
- Document ID
- WP428
- Release Date
- 2017-12-07
- Revision
- 1.0.1 English