Negative-Bias Temperature Instability (NBTI) Effects in 90 nm PMOS(WP224) - Describes Negative-Bias Temperature Instability (NTBI), an unwanted transistor behavior that is pervasive in all deep sub-micron designs. - WP224
wp224.pdf
- Document ID
- WP224
- Release Date
- 2005-11-20
- Revision
- 1.1 English