Internal Test Scan Disable (Passive) - Internal Test Scan Disable (Passive) - XAPP1098

Developing Tamper-Resistant Designs with UltraScale and UltraScale+ FPGAs (XAPP1098)

Document ID
XAPP1098
Release Date
2025-05-22
Revision
1.5.1 English

Internal for-test-only scan functionality (used only by AMD) is always disabled if RSA authentication or AES decryption is enabled. Additionally, the SCAN_DIS eFUSE can be programmed to permanently disable internal test scan capability.