UltraScale+ Device SEL - UG584

The device-level SEL is not destructive for UltraScale+ devices when operating within the Earth’s atmosphere. The device continues to operate with any potential impact isolated to the function of the block where the SEL occurred. The SEL only impacts the operation of the SYSMON block or the HP I/O pin where it occurred. SEL due to alpha particles or thermal neurtrons was not observed in SYSMON blocks (V_CCAUX) or HP I/O auxiliary blocks (V_{CCAUX_IO}).

The residual SEL rate for a ZU9EG device is approximately 0.25 FIT at 85°C junction temperature (T_j), and 0.65 FIT at 125°C T_j at New York City sea-level. The device-level SEL rate scales based on the previously mentioned resource count in each device, and based on T_j along with the relative neutron flux per the following guidance:

• Device SEL rate [FIT] = SYSMON SEL rate + HP I/O auxiliary block SEL rate
• SYSMON SEL rate [FIT] = 0.050 × Number of SYSMONs × Avg flux scaling × Avg T_j scaling
• HP I/O auxiliary SEL rate [FIT] = 0.0008 × Number of HP I/O auxiliary blocks × Avg flux scaling × Avg T_j scaling

AMD provides an SEU FIT rate calculator tool to calculate the relative flux scale factor. For more information or to download the calculator, go to https://www.xilinx.com/member/avionics.