Failure Rate Summary - Failure Rate Summary - UG116

Device Reliability Report (UG116)

Table 1. Summary of the Failure Rates
Process Technology	Device Hours at T_J = 125°C	FIT¹
7 nm	1,019,927	12
16 nm	1,112,470	11
20 nm	1,052,011	11
28 nm	1,002,204	12
40 nm	1,026,242	11
45 nm	1,003,536	12
65 nm	1,175,219	10
90 nm	6,248,253	2
130 nm	1,462,363	8
220 nm/180 nm	1,000,645	12
350 nm/250 nm	1,137,973	10
350 nm	2,037,870	6
FIT is calculated based on 0.7 eV (0.58 eV for EPROM), 60% C.L. and T_J of 55°C.