Reliability Estimation - 4.1 English

Soft Error Mitigation Controller Product Guide (PG036)

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4.1 English

As a starting point, your specification for system reliability should highlight critical sections of the system design and provide a value for the required reliability of each sub-section. Reliability requirements are typically expressed as failures in time (FIT), which is the number of design failures that can be expected in 10 9 hours (approximately 114,155 years).

When more than one instance of a design is deployed, the probability of a soft error affecting any one of them increases proportionately. For example, if the design is shipped in 1,000 units of product, the nominal FIT across all deployed units is 1,000 times greater. This is an important consideration because the nominal FIT of the total deployment can grow large and can represent a service or maintenance burden.

The nominal FIT is different from the probability of an individual unit being affected. Also, the probability of a specific unit incurring a second soft error is determined by the FIT of the individual design and not the deployment. This is an important consideration when assessing suitable soft error mitigation strategies for an application.

The FIT associated with soft errors must not be confused with that of product life expectancy, which considers the replacement or physical repair of some part of a system.

AMD device FIT data is reported in the Device Reliability Report (UG116) [Ref 2] . The data reveals the overall infrequency of soft errors.

TIP: The failure rates involved are so small that most designs do not include any form of soft error mitigation.

The contribution to FIT from flip-flops is negligible based on the flip-flop’s very low FIT and small quantity. However, this does not discount the importance of protecting the design state stored in flip-flops. If any state stored in flip-flops is highly important to design operation, the design must contain logic to detect, correct, and recover from soft errors in a manner appropriate to the application.

The contribution to FIT from Distributed Memory and Block Memory can be large in designs where these resources are highly utilized. As previously noted, the FIT contribution can be substantially decreased by using soft error mitigation techniques in the design. For example, Block Memory resources include built-in error detection and correction circuits that can be used in certain Block Memory configurations. For all Block Memory and Distributed Memory configurations, soft error mitigation techniques can be applied using programmable logic resources.

The contribution to FIT from Configuration Memory is large. Without using an error classification technique, all soft errors in Configuration Memory must be considered “essential,” and the resulting contribution to FIT eclipses all other sources combined. Use of error classification reduces the contribution to FIT by no longer considering most soft errors as failures; if a soft error has no effect, it can be corrected without any disruption.

In designs requiring the highest level of reliability, classification of soft errors in Configuration Memory is essential. This capability is provided by the SEM Controller.