JTAG TDO Has Reduced Hold Time At Exit From Shift-IR State

Versal HBM Series Production Errata (EN334)

Document ID
EN334
Release Date
2024-02-01
Revision
1.0 English

AMD Answer 000035627

The JTAG test data output (TDO) has reduced hold time (less than the expected half TCK clock period) at exit from the shift instruction register (Shift-IR) state.

This issue will not be fixed.