K24 Reliability - K24 Reliability - DS985

Kria K24 SOM Data Sheet (DS985)

Document ID
DS985
Release Date
2025-05-22
Revision
1.2 English

The following table captures a summary of the reliability testing completed on the K24 SOM. All reliability testing was done with the production SOM assembly inclusive of the circuit card assembly and aluminum thermal interface plate. For the full K24 SOM reliability and qualification report request access to the Kria SOM Qualification Report Lounge .

Table 1. Reliability Testing
Reliability Test K24C SOM (Commercial) K24I SOM (Industrial)
Temperature cycling JESD22-A104, Condition J (0°C to 100°C) JESD22-A104, Condition T (–40°C to 100°C)
Power cycling Ta = 65°C, RH = 80%; 55 min ON, 5 min OFF Ta = 75°C, RH = 80%; 55 min ON, 5 min OFF
Strife power cycling Power cycling, 0°C; 1 min ON, 1 min OFF Power cycling, –40°C; 1 min ON, 1 min OFF
Temperature and humidity Ta = 85°C, RH = 85% Ta = 85°C, RH = 85%
Sinusoidal Vibration IEC 60028-2-6, 1 Gpk IEC 60028-2-6, 5 Gpk
Mechanical vibration IEC 60068-2-64, 1.9 Grms IEC 60068-2-64, 5.04 Grms
Mechanical shock IEC 60068-2-27, 40 G JESD22-B110, 100 G
Connector insertion life Room temperature for both the SOM240_1 and SOM40 connectors Room temperature for both the SOM240_1 and SOM40 connectors
  1. Samtec has performed connector level testing following EIA-364-09C, while AMD has performed mechanical wellness testing of the bond between the PCB and the mating connector. Refer to the Samtec website for more information on connector reliability specifications.