FTCECLK
|
Trace clock frequency (MIO) |
– |
200 |
– |
200 |
– |
200 |
– |
200 |
– |
167
2
|
MHz |
Trace clock frequency (EMIO) |
– |
400 |
– |
350 |
– |
350 |
– |
300 |
– |
250
3
|
MHz |
FDBGTCECLK
|
Trace debug (DBG_TRACE) clock frequency |
– |
400 |
– |
400 |
– |
400 |
– |
400 |
– |
333
4
|
MHz |
TTCECKO
|
Trace clock to output delay, all outputs |
–0.5 |
0.5 |
–0.5 |
0.5 |
–0.5 |
0.5 |
–0.5 |
0.5 |
–0.5 |
0.5 |
ns |
TTCECKO
|
Trace clock duty cycle |
45 |
55 |
45 |
55 |
45 |
55 |
45 |
55 |
45 |
55 |
% |
- The test conditions are configured
to the LVCMOS 3.3V I/O standard with a 12 mA drive strength, fast slew rate, and a
15 pF load.
- The -1LLI and -1LSI low-power
devices support an overdrive voltage where the maximum trace clock frequency (MIO)
is 200 MHz when VCC_PSLP = 0.88V or VCC_PMC = 0.88V.
- The -1LLI and -1LSI low-power
devices support an overdrive voltage where the maximum trace clock frequency
(EMIO) is 280 MHz when VCC_PSFP = 0.88V.
- The -1LLI and -1LSI
low-power devices support an overdrive voltage where the maximum trace debug clock
frequency is 400 MHz when VCC_PSFP = 0.88V.
|