The detection of latent faults is supported with these features:
- All LPD memories can be tested at full-processing speed during
boot by MBIST
- Most of these memories (excluding PPU and RCU RAMs) can be tested on demand during execution
- The functionality and status of TCM, OCM, PPU RAM, RPU lockstep, PPU, XMPU, XPPU, clocks, voltages, and temperatures can be tested and evaluated through the dedicated software test library (STL)