If the answers to ALL three of the following power-on test questions are NO, then the PS eFUSE integrity might be impacted during power-on.
See the "When further analysis is needed" section below.
- Power-on test 1: Does PS_POR_B meet the datasheet requirements for power-on and is asserted low (GND) until VCCPINT, VCCPAUX , and VCCO_MIO0 have reached their minimum voltage levels? If YES, then NO RISK. Passing this test is represented in solution 1.
- Power-on test 2: Is the PS reference clock (PS_CLK) inactive until VCCPINT has reached 0.80V? If YES, then NO RISK. Passing this test is represented in solution 2.
- Power-on test 3: Does the power supply sequence follow the recommended power-on sequence (1: VCCPINT, 2: VCCPAUX, 3: VCCO_MIO0)?
VCCPINT must reach 0.80V before both VCCPAUX reaches 0.70V and VCCO_MIO0 reaches 0.90V.
If YES, then NO RISK. Passing this test is represented in solution 3.