Xil_TestIO8 - 2023.1 English

Standalone Library Documentation: BSP and Libraries Document Collection (UG643)

Document ID
UG643
Release Date
2023-05-16
Version
2023.1 English

Perform a destructive 8-bit wide register IO test where the register is accessed using Xil_Out8 and Xil_In8, and comparing the written values by reading them back.

Prototype

s32 Xil_TestIO8(u8 *Addr, s32 Length, u8 Value);

Parameters

The following table lists the Xil_TestIO8 function arguments.

Table 1. Xil_TestIO8 Arguments
Name Description
Addr Pointer to the region of memory to be tested.
Length Length of the block.
Value Constant used for writing the memory.

Returns

  • -1 is returned for a failure
  • 0 is returned for a pass